EDXRF for quality control applications
Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.
EDXRF with high precision and broad elemental coverage
The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).
EDXRF with autosampler, helium and FP options
Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.
· Features
- Analyze 11Na to 92U non-destructively
- Solids, liquids, alloys, powders and thin films
- 50kV X-ray tube for wide elemental coverage
- SDD detector for superior resolution and sensitivity
- Modern smartphone style "icon driven" user interface
- Multiple automated tube filters for enhanced sensitivity
- Convenient built in thermal printer
- Low cost with unmatched performance-to-price ratio
- Optinal fundemental parameters