Refractive index:
- Range of Refractive index: 1.30 - 1.72 nD
- Resolution: ± 0.0001 nD
- Accuracy: ± 0.0001 nD
Brix:
- Brix range: 0 – 100 % Brix
- Resolution: 0.01 %
- Accuracy: 0.05 %
- Measuring Principle: Critical angle of total reflection measurement by shadowline detection with CCD array
Sample/Prism Temperature Control by built-in solid state thermostat (Peltier):
- Temperature range: 10 °C - 60 °C
- Temperature probe accuracy (valid at refractometry standard conditions (T=20 °C, 589 nm, ambient temperature approx. 23 °C): ± 0.05 °C
- Temperature probe stability (valid at refractometry standard conditions (T=20 °C, 589 nm, ambient temperature approx. 23 °C) : ± 0.002 °C
Materials in Contact with Samples:
- Prism: Synthetic saphire
- Sample mold: Stainless steel
- Seal: FFKM (Perfluoroelastomer)
Components:
- Light source: LED Light source, average life time > 100,000 h
- Wavelength (by wavelength-adjusted interference filter): 598 nm
- Power requirements: 100-240 VAC +10%/-15%, 50/60 Hz, min. 10 W, max. 100 W, depending on sample temperature setting and ambient temperature
- Dimensions: 300 x 145 x 330 mm W x H x D [mm]
- Weight [kg]: 6.5