EDXRF optimized for quality control applications

Specifically designed for routine quality control elemental analysis applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

EDXRF with broad elemental coverage

The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of XRF applications versatility and low limits-of-detection (LOD).

NEX QC options: autosampler, helium and FP

Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity. For those applications requiring higher resolution and sensitivity, Rigaku offers the new NEX QC+ energy dispersive X-ray fluorescence analyser which is equipped with a silicon drift detector (SDD).

Features

• Analyze ¹¹Na to ⁹²U non-destructively
• Solids, liquids, alloys, powders and thin films
• 50kV X-ray tube for wide elemental coverage
• Semiconductor detector for superior data quality
• Modern smartphone style "icon driven" user interface
• Multiple automated tube filters for enhanced sensitivity
• Convenient built in thermal printer
• Low cost with unmatched performance-to-price ratio
• Optional fundamental parameters