X-ray diffraction (XRD) Smartlab

Home

About us

News

Products

Request

Home page » products » Material characterization » X-ray diffraction (XRD) products

Home page » products » Material characterization » X-ray diffraction (XRD) products » X-ray diffraction (XRD) Smartlab

The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert standing by your side.

Features

Engineered for Performance

The system incorporates a high resolution θ/θ closed loop goniometer drive system, cross beam optics (CBO), an in-plane scattering arm, and an optional 9.0 kW rotating anode generator.

Designed for Flexibility

Coupling a computer controlled alignment system with a fully automated optical system and the Guidance software makes it easy to switch between hardware modes, ensuring that your hardware complexity is never holding back your research.

Functionality Redefined

Whether you are working with thin films, nanomaterials, powders, or liquids the SmartLab will give you the functionality to make the measurements you want to make when you want to make them.

Features:

Full automated alignment under computer control.
Optional in-plane diffraction arm for in-plane measurements without reconfiguration.
Focusing and parallel beam geometries without reconfiguration.
SAXS capabilities

Specification

Sealed tube generator	Maximum rated output	3 kW
	Rated tube voltage - current	20 - 60 kV; 2 - 60 mA
	Stability	Within ±0.005% for 10% input power variation
	Target	Cu (others: optional)
	Focus size	0.4 x 12 mm line/point (others: optional)
	Radiation enclosure	Full safety shielding with failsafe open/close mechanism
Rotating anode generator	Maximum rated output	9 kW
	Rated tube voltage - current	20 - 45 kV; 10 - 200 mA
	Stability	Within ±0.005% for 10% input power variation
	Target	Cu (others: optional)
	Focus size	0.4 x 8 mm line/point
	Radiation enclosure	Full safety shielding with fail safe open/close mechanism
Goniometer	Scanning mode	θs/θd coupled or θs, θd independent optical encoder controlled
	Goniometer radius	300 mm
	Minimum step size	0.0001°
	Eulerian cradle	χ: -5 to 95°/0.001° step
		φ: -720 to 720°/0.002° step
		Ζ: -4 to 1 mm/0.0005 mm step
		Optional X, Y stages: 20 mm/0.0005 mm step, 100 mmφ/0.0005 mm step, 150 mmφ/0.0005 mm step
		Optional Rx, Ry stage: -5 to 5°/0.002° step
	Sample size	Max. 200 mmφ x 6 mm thick (24 mm thick, optional)
Optics	Incidence optics	CBO, Ge 2-bounce and 4-bounce monochromators, automatic variable divergence slit
Optics	Receiving optics	Automatic variable scattering slit PSA, Ge 2-bounce analyzer, automatic variable receiving slit
Detector	Scintillation counter	Scintillator NaI, photomultiplier with preamplifier