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Nikon offers a number of advanced microscope software solutions to control and optimize the performance of its products, including NIS-Elements microscope imaging software. Each is powerful, easy-to-use, and customizable to meet the application requirements.
Features

Never before has a microscope software package achieved such recognition for comprehensive device control with a suite of image analysis, visualization and archiving tools.

Nikon's NIS-Elements revolutionizes imaging software for the microscopy market by combining automated intelligence to microscopes, cameras, components and peripherals with powerful archiving, analysis, visualization and achiving tools. Its intuitive interface simplifies workflow and makes fast acquisition possible while providing powerful features such as large image stitching, automated object counting, 3D volume rendering, high dynamic range, extended depth of focus, and ratio and FRET analysis.

NIS- elements Advanced Research: Optimized for advanced research applications, NIS-Elements AR features fully automated acquisition and device control through full six-dimensional image acquisition and analysis.

NIS- elements Basic Research: Developed for standard research applications such as analysis and photodocumentation of fluorescent imaging,  NIS-Elements BR features up to four dimensional acquisition advanced device control capabilities.

NIS- elements Documentation: NIS-Elements Documentation software provides a totally integrated solution for users of Nikon and other manufacturers' accessories by delivering color documentation capabilities that include basic measuring and reporting.

NIS- elements Confocal: NNIS-Elements C software enables full integration of confocal specific acquisition controls together with advanced image analysis functionality.

NIS-Elements HC: NIS-Elements HC supports total operation of high-content analysis, from integrated microscope control and peripheral devices such as well plate loaders and CCD cameras, to image data management.

 

Specification
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