X-ray fluorescence (XRF) spectrometers NEX QC+
For more demanding applications, or for situations where analysis time or sample throughput is critical, Rigaku offers the new NEX QC+ spectro¬meter. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics, resulting in superior calibrations and measurement precision for the most challenging measurements.
  1. Features
  2. Specification

EDXRF for quality control applications

Specifically designed for routine quality control applications, the new Rigaku NEX QC+ features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

EDXRF with high precision and broad elemental coverage

The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).

EDXRF with autosampler, helium and FP options

Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

·         Features
  • Analyze 11Na to 92U non-destructively
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube for wide elemental coverage
  • SDD detector for superior resolution and sensitivity
  • Modern smartphone style "icon driven" user interface
  • Multiple automated tube filters for enhanced sensitivity
  • Convenient built in thermal printer
  • Low cost with unmatched performance-to-price ratio
  • Optinal fundemental parameters

Excitation

  • 50kV X-ray tube
  • 4W max power
  • 6 tube filter positions with shutter

Detection

  • High performance semiconductor detector
  • Peltier thermo-electric cooling
  • Optimum balance of spectral resolution and max count rate

Sample Chamber

  • Large 190 x 165 x 60 mm sample chamber
  • Single position 32 mm sample aperture
  • Single position 40 mm sample aperture
  • Bulk sample aperture
    6-position 32 mm automatic sample changer
  • 5-position 40 mm automatic sample chamber
  • Single position 32 mm sample spinner
  • Analysis in air or helium

Environmental Conditions

  • Ambient temperature 10-35ºC (50-95ºF)
  • Relative humidity ≤85% non-condensing
  • Vibration: undetectable by people
  • Free from corrosive gas, dust and particles

Software & Application Packages

  • Qualitative and quantitative analysis
  • Normalization and validation feature
  • Fundamental parameters
  • Data export function with LIMS compatibility
  • User selectable shaping times
  • Simple flow bar wizard to create new applications
  • Icon driven graphical user interface

User Interface

  • Embedded computer
  • Internal thermal printer
  • USB & Ethernet connections

Spectrometer Data

  • Single phase AC 100/220V, 1.4A (50/60 Hz)
  • Dimensions: 33.1(W) X 43.2(D) X 37.6(H) cm (13 X 17 X 14.8 inch)
  • Weight: 16 kg (35 lbs)

Options

  • 6-position 32 mm automatic sample changer
  • 5-position 40 mm automatic sample chamber
  • Single position 32 mm sample spinner
  • Helium purge
  • Fundamental parameters